SANSEVERINO, ANNUNZIATA
SANSEVERINO, ANNUNZIATA
A METHOD FOR IN-SITU CHARACTERIZATION OF SEMICONDUCTOR INTERFACE DURING A-SI SOLAR CELL FABRICATION
2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; N., Martucciello; F., Roca
COMPLETE 2D SIMULATION PROCEDURE FOR AN IMMEDIATE FEEDBACK BETWEEN TECHNOLOGICAL PROCESSES AND SOLAR CELL EFFICIENCY
2002 Daliento, Santolo; Sanseverino, Annunziata; M., Izzi; L., Pirozzi
AN EXPERIMENTAL CLASSIFICATION OF DRAIN AND GATE CURRENT PULSES IN LOW-VOLTAGE POWER MOSFETS DURING RADIATION EXPOSURE
2002 Sanseverino, Annunziata; X., Velardi; F., Iannuzzo; G., Busatto; J., Wyss
QUASI STEADY-STATE AND TRANSIENT PCD LIFETIME MEASUREMENTS IN SILICON MATERIALS FOR PHOTOVOLTAIC CONCENTRATION DEVICES, A COMPARISON WITH THE TRANSVERSE PROBETECHNIQUE
2004 Daliento, Santolo; Irace, Andrea; L., Mele; Sanseverino, Annunziata; L., Pirozzi; M., Izzi; U., Besi; G., Arabito
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE SURFACE RECOMBINATION VELOCITY
2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; G., Contento; N., Martucciello; I., Nasti; F., Roca
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE
2003 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE TERMINAL TEST STRUCTURE
2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
WEAR MEASUREMENTS BY MEANS OF RADIOACTIVE ION IMPLANTATION
2002 Daliento, Santolo; Sanseverino, Annunziata; L., Gialanella; Imbriani, Gianluca; Roca, Vincenzo; M., Romano; N., Decesare; A. D., Onofrio; F., Terrasi; H. W., Becker; D., Rogalla; A., Stephan; F., Strieder; Z., Fulop; G., Gyurky; E., Somorjai; Russo, Michele
A NEW TEST STRUCTURE FOR IN-SITU MEASUREMENTS OF INTERFACE RECOMBINATION DURING SURFACE TREATMENTS
2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
| Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|---|
| A METHOD FOR IN-SITU CHARACTERIZATION OF SEMICONDUCTOR INTERFACE DURING A-SI SOLAR CELL FABRICATION | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; N., Martucciello; F., Roca | |
| COMPLETE 2D SIMULATION PROCEDURE FOR AN IMMEDIATE FEEDBACK BETWEEN TECHNOLOGICAL PROCESSES AND SOLAR CELL EFFICIENCY | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Sanseverino, Annunziata; M., Izzi; L., Pirozzi | |
| AN EXPERIMENTAL CLASSIFICATION OF DRAIN AND GATE CURRENT PULSES IN LOW-VOLTAGE POWER MOSFETS DURING RADIATION EXPOSURE | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Sanseverino, Annunziata; X., Velardi; F., Iannuzzo; G., Busatto; J., Wyss | |
| QUASI STEADY-STATE AND TRANSIENT PCD LIFETIME MEASUREMENTS IN SILICON MATERIALS FOR PHOTOVOLTAIC CONCENTRATION DEVICES, A COMPARISON WITH THE TRANSVERSE PROBETECHNIQUE | 4.1 Articoli in Atti di convegno | 2004 | Daliento, Santolo; Irace, Andrea; L., Mele; Sanseverino, Annunziata; L., Pirozzi; M., Izzi; U., Besi; G., Arabito | |
| AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE SURFACE RECOMBINATION VELOCITY | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; G., Contento; N., Martucciello; I., Nasti; F., Roca | |
| AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE | 1.1 Articolo in rivista | 2003 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca | |
| AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE TERMINAL TEST STRUCTURE | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca | |
| WEAR MEASUREMENTS BY MEANS OF RADIOACTIVE ION IMPLANTATION | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Sanseverino, Annunziata; L., Gialanella; Imbriani, Gianluca; Roca, Vincenzo; M., Romano; N., Decesare; A. D., Onofrio; F., Terrasi; H. W., Becker; D., Rogalla; A., Stephan; F., Strieder; Z., Fulop; G., Gyurky; E., Somorjai; Russo, Michele | |
| A NEW TEST STRUCTURE FOR IN-SITU MEASUREMENTS OF INTERFACE RECOMBINATION DURING SURFACE TREATMENTS | 4.1 Articoli in Atti di convegno | 2002 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca |