In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.
Lock-in thermography for the localization of prebreakdown leakage current on power diodes / Irace, Andrea; Breglio, Giovanni; Riccio, Michele. - STAMPA. - (2009), pp. 208-211. (Intervento presentato al convegno PRIME tenutosi a Cork nel 12-17 July 2009) [10.1109/RME.2009.5201357].
Lock-in thermography for the localization of prebreakdown leakage current on power diodes
IRACE, ANDREA;BREGLIO, GIOVANNI;RICCIO, MICHELE
2009
Abstract
In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.File in questo prodotto:
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