Settling phenomena that occur at voltage switchings are analyzed and their effects on the integrity of the output waveform highlighted. In particular, the settling is modeled in order to estimate the spectral features it produces. According to the model, the settling is responsible for an additional spectral content in the output signal, which is related to damping and ringing parameters. As a result, a thorough analysis of such additional spectral content could inform on specific aspects of the settling phenomena. The paper is intended to be a first step that can open the way for an alternative method, based on frequency domain measurements, for assessing DAC dynamic performance related to poor settling time.

Analyzing DAC waveform distortion due to finite settling time / D'Apuzzo, Massimo; D'Arco, Mauro; Liccardo, Annalisa; Vadursi, M.. - ELETTRONICO. - (2010), pp. 5488037.352-5488037.356. (Intervento presentato al convegno IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2010 tenutosi a Austin, TX, USA nel May, 3-6, 2010) [10.1109/IMTC.2010.5488037].

Analyzing DAC waveform distortion due to finite settling time

D'APUZZO, MASSIMO;D'ARCO, MAURO
;
LICCARDO, ANNALISA;
2010

Abstract

Settling phenomena that occur at voltage switchings are analyzed and their effects on the integrity of the output waveform highlighted. In particular, the settling is modeled in order to estimate the spectral features it produces. According to the model, the settling is responsible for an additional spectral content in the output signal, which is related to damping and ringing parameters. As a result, a thorough analysis of such additional spectral content could inform on specific aspects of the settling phenomena. The paper is intended to be a first step that can open the way for an alternative method, based on frequency domain measurements, for assessing DAC dynamic performance related to poor settling time.
2010
9781424428335
Analyzing DAC waveform distortion due to finite settling time / D'Apuzzo, Massimo; D'Arco, Mauro; Liccardo, Annalisa; Vadursi, M.. - ELETTRONICO. - (2010), pp. 5488037.352-5488037.356. (Intervento presentato al convegno IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2010 tenutosi a Austin, TX, USA nel May, 3-6, 2010) [10.1109/IMTC.2010.5488037].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/365422
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