X-ray induced radiation damage is a frequent phenomenon, especially when using third generation synchrotrons. Raman microscopy prior and after X-ray data collection can be a valuable tool to detect artifacts derived from radiation damage. Here we propose X-ray photolysis on crystals of NO-Hb as an additional experimental source of denitrosylation. The system under investigation is the Hb from an Antarctic fish, Trematomus bernacchii (HbTb). To the best of our knowledge, this is the first Raman-assisted crystallographic evidence of X-ray induced NO-photodissociation at a 3rd generation synchrotron (beamline X10SA of the Swiss Light Source).

Selective X-ray induced NO-photodissociation in hemoglobin crystals: evidences from a crystallography-assisted Raman microscopy study / Merlino, Antonello; M. R., Fuchs; A., Balsamo; Pica, Andrea; F., Dworkowski; G., Pompidor; L., Mazzarella; Vergara, Alessandro. - ELETTRONICO. - (2012), pp. 15-15. ( 3rd Workshop on the Simultaneous Combination of Spectroscopies with X-ray Absorption, Scattering and Diffraction Techniques Zurich July 4 – 6, 2012).

Selective X-ray induced NO-photodissociation in hemoglobin crystals: evidences from a crystallography-assisted Raman microscopy study

MERLINO, ANTONELLO;PICA, ANDREA;VERGARA, ALESSANDRO
2012

Abstract

X-ray induced radiation damage is a frequent phenomenon, especially when using third generation synchrotrons. Raman microscopy prior and after X-ray data collection can be a valuable tool to detect artifacts derived from radiation damage. Here we propose X-ray photolysis on crystals of NO-Hb as an additional experimental source of denitrosylation. The system under investigation is the Hb from an Antarctic fish, Trematomus bernacchii (HbTb). To the best of our knowledge, this is the first Raman-assisted crystallographic evidence of X-ray induced NO-photodissociation at a 3rd generation synchrotron (beamline X10SA of the Swiss Light Source).
2012
Selective X-ray induced NO-photodissociation in hemoglobin crystals: evidences from a crystallography-assisted Raman microscopy study / Merlino, Antonello; M. R., Fuchs; A., Balsamo; Pica, Andrea; F., Dworkowski; G., Pompidor; L., Mazzarella; Vergara, Alessandro. - ELETTRONICO. - (2012), pp. 15-15. ( 3rd Workshop on the Simultaneous Combination of Spectroscopies with X-ray Absorption, Scattering and Diffraction Techniques Zurich July 4 – 6, 2012).
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/518914
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact