Additive Layer Manufacturing is one of the most promising and investigated manufacturing system due to its advantages to produces near net shape components, also with a very complex shape, in a single shot. Among the different techniques now available, the Electron Beam Melting (EBM) is of particular interest in the production of metal components. Particularly the application of this technique to titanium alloys allows to produces components with a very low buy to fly ratio. In the present paper the microstructure attained is accurately described and mini tensile tests performed allowed to understand the fracture behavior of specimen with the specific microstructure realized under static load. © 2016 Author(s).
Microstructural and micromechanical study of a Ti6Al4V component made by electron beam melting / Scherillo, Fabio; Franchitti, S.; Borrelli, R.; Pirozzi, C.; Squillace, Antonino; Langella, Antonio; Carrino, Luigi. - 1769:unico(2016), p. 190005. (Intervento presentato al convegno 19th International ESAFORM Conference on Material Forming, ESAFORM 2016 tenutosi a Nantes nel 27 April 2016 through 29 April 2016) [10.1063/1.4963615].
Microstructural and micromechanical study of a Ti6Al4V component made by electron beam melting
SCHERILLO, Fabio;SQUILLACE, ANTONINO;LANGELLA, ANTONIO;CARRINO, LUIGI
2016
Abstract
Additive Layer Manufacturing is one of the most promising and investigated manufacturing system due to its advantages to produces near net shape components, also with a very complex shape, in a single shot. Among the different techniques now available, the Electron Beam Melting (EBM) is of particular interest in the production of metal components. Particularly the application of this technique to titanium alloys allows to produces components with a very low buy to fly ratio. In the present paper the microstructure attained is accurately described and mini tensile tests performed allowed to understand the fracture behavior of specimen with the specific microstructure realized under static load. © 2016 Author(s).I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
