A calibration method exploiting a single external reference is proposed for sensors arrays in presence of a measurand non-linear gradient in the system under test. The calibration artifacts due to a non-uniform distribution of the measurand in the system under test, not detected by the single punctual reference sensor, are avoided. A proof-of-principle demonstration is carried out within the case study of a thermistors array obtaining compatible result with respect to a standard method which requires a reference sensor for each element of the sensor array. Thus, the complexity (and cost) of standard calbration setups is reduced by using a single reference sensor without sacrifying significantly the calibration accuracy.

Sensor array calibration by a single reference in presence of measurand non-linear gradient / Arpaia, P.; Baccigalupi, C.; Cesaro, U.; Chadli, M.; Coppieri, H.; Pezzetti, M.; Severino, G.. - (2018), pp. 1-4. (Intervento presentato al convegno 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 tenutosi a Royal Sonesta Hotel, usa nel 2018) [10.1109/I2MTC.2018.8409713].

Sensor array calibration by a single reference in presence of measurand non-linear gradient

Arpaia P.;Cesaro U.;Chadli M.;
2018

Abstract

A calibration method exploiting a single external reference is proposed for sensors arrays in presence of a measurand non-linear gradient in the system under test. The calibration artifacts due to a non-uniform distribution of the measurand in the system under test, not detected by the single punctual reference sensor, are avoided. A proof-of-principle demonstration is carried out within the case study of a thermistors array obtaining compatible result with respect to a standard method which requires a reference sensor for each element of the sensor array. Thus, the complexity (and cost) of standard calbration setups is reduced by using a single reference sensor without sacrifying significantly the calibration accuracy.
2018
978-1-5386-2222-3
Sensor array calibration by a single reference in presence of measurand non-linear gradient / Arpaia, P.; Baccigalupi, C.; Cesaro, U.; Chadli, M.; Coppieri, H.; Pezzetti, M.; Severino, G.. - (2018), pp. 1-4. (Intervento presentato al convegno 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 tenutosi a Royal Sonesta Hotel, usa nel 2018) [10.1109/I2MTC.2018.8409713].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/848628
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