A critical review of techniques for the experimental extraction of the thermal resistance of bipolar transistors from DC measurements–Part I: Thermometer-based approaches / D’Alessandro, Vincenzo; Catalano, ANTONIO PIO; Scognamillo, Ciro; Müller, Markus; Schröter, Michael; Zampardi, Peter J.; Codecasa, Lorenzo. - In: ELECTRONICS. - ISSN 2079-9292. - 12:16(2023). [10.3390/electronics12163471]

A critical review of techniques for the experimental extraction of the thermal resistance of bipolar transistors from DC measurements–Part I: Thermometer-based approaches

Vincenzo d’Alessandro;Antonio Pio Catalano;Ciro Scognamillo;Lorenzo Codecasa
2023

2023
A critical review of techniques for the experimental extraction of the thermal resistance of bipolar transistors from DC measurements–Part I: Thermometer-based approaches / D’Alessandro, Vincenzo; Catalano, ANTONIO PIO; Scognamillo, Ciro; Müller, Markus; Schröter, Michael; Zampardi, Peter J.; Codecasa, Lorenzo. - In: ELECTRONICS. - ISSN 2079-9292. - 12:16(2023). [10.3390/electronics12163471]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/946449
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