The attainment of high-quality Josephson junctions on electro-optical substrates constitutes a key step toward the fabrication of functional superconducting opto-electronics. We report on the fabrication of high-quality all-refractory niobium superconducting tunnel junctions deposited on X-cut LiNbO3 single crystals. A high quality factor Vm=0.7 DIgR2 mV swhere DIg is the current jump at the sum gap voltage and R2 mV the static resistance at V=2 mVd up to 61 mV has been measured at T=4.2 K. The very low contribution of subgap leakage currents is demonstrated by the BCS-like quasiparticle current measured at V=0.1 mV down to T=1.9 K.

High quality superconducting Josephson junctions on LiNO3 electro-optical crystals�, / Parlato, Loredana; Pepe, GIOVANNI PIERO; Latempa, Rossella; Dacunto, P; Peluso, Giuseppe; Barone, Antonio; Granata, C. AND RUSSO M.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 86:(2005), pp. 202501-1-202501-3. [10.1063/1.1927697]

High quality superconducting Josephson junctions on LiNO3 electro-optical crystals�,

PARLATO, LOREDANA;PEPE, GIOVANNI PIERO;LATEMPA, ROSSELLA;PELUSO, GIUSEPPE;BARONE, ANTONIO;
2005

Abstract

The attainment of high-quality Josephson junctions on electro-optical substrates constitutes a key step toward the fabrication of functional superconducting opto-electronics. We report on the fabrication of high-quality all-refractory niobium superconducting tunnel junctions deposited on X-cut LiNbO3 single crystals. A high quality factor Vm=0.7 DIgR2 mV swhere DIg is the current jump at the sum gap voltage and R2 mV the static resistance at V=2 mVd up to 61 mV has been measured at T=4.2 K. The very low contribution of subgap leakage currents is demonstrated by the BCS-like quasiparticle current measured at V=0.1 mV down to T=1.9 K.
2005
High quality superconducting Josephson junctions on LiNO3 electro-optical crystals�, / Parlato, Loredana; Pepe, GIOVANNI PIERO; Latempa, Rossella; Dacunto, P; Peluso, Giuseppe; Barone, Antonio; Granata, C. AND RUSSO M.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 86:(2005), pp. 202501-1-202501-3. [10.1063/1.1927697]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/100472
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