A model of a new technique to measure the spatial distribution of the majority and minority carrier lifetime along epilayers is presented.
AN ANALYTICAL MODEL OF AN OCVD-BASED MEASUREMENT TECHNIQUE OF THE LOCAL CARRIER LIFETIME / Bellone, S; Licciardo, G; Guerriero, Gabriele; Rubino, A.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - (2007), pp. 2998-3006.
AN ANALYTICAL MODEL OF AN OCVD-BASED MEASUREMENT TECHNIQUE OF THE LOCAL CARRIER LIFETIME
GUERRIERO, GABRIELE;
2007
Abstract
A model of a new technique to measure the spatial distribution of the majority and minority carrier lifetime along epilayers is presented.File in questo prodotto:
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