Organic film thickness influence on the bias stress instability in sexithiophene field effect transistors / Di Girolamo, F.V., Cassinese, A., Aruta, C., Barra, M.. - In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING. - ISSN 0947-8396. - STAMPA. - 96:2(2009), pp. 481-487.
Organic film thickness influence on the bias stress instability in sexithiophene field effect transistors
CASSINESE, ANTONIO;ARUTA, CARMELA;BARRA, Mario
2009
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