We present innovative near-field test ranges, named compact-near-field (CNF) and very-near-field (VNF). These use photonic probes, and advanced near-field far-field (NFFF) transformations from amplitude and phase (complex) or phaseless measurements. The photonic probe allows AUT-probe distances of less than one wavelength. This drastically reduces test-range and scanner dimensions, improves the signal-to-clutter ratio and the signal-to-noise ratio, and reduces the scanning area and time. In both the cases of complex and phaseless measurements, the neat-field-to-far-field transformation problem is properly formulated to further improve the rejection of clutter, noise, and truncation error. The advantages of the compact-near-field and very-near-field test ranges are discussed and numerically analyzed. Experimental results are presented for both planar and cylindrical scanning geometries.
Photonic probes and advanced (also phaseless) near-field far-field techniques / Capozzoli, A., Curcio, C., D'Elia, G., Liseno, A., Vinetti, P., M., A., M., H., S., K., K., K.. - In: IEEE ANTENNAS & PROPAGATION MAGAZINE. - ISSN 1045-9243. - 52:5(2010), pp. 232-241. [10.1109/MAP.2010.5687550]
Photonic probes and advanced (also phaseless) near-field far-field techniques
CAPOZZOLI, AMEDEO;CURCIO, CLAUDIO;D'ELIA, GIUSEPPE;LISENO, ANGELO;VINETTI, PIETRO;
2010
Abstract
We present innovative near-field test ranges, named compact-near-field (CNF) and very-near-field (VNF). These use photonic probes, and advanced near-field far-field (NFFF) transformations from amplitude and phase (complex) or phaseless measurements. The photonic probe allows AUT-probe distances of less than one wavelength. This drastically reduces test-range and scanner dimensions, improves the signal-to-clutter ratio and the signal-to-noise ratio, and reduces the scanning area and time. In both the cases of complex and phaseless measurements, the neat-field-to-far-field transformation problem is properly formulated to further improve the rejection of clutter, noise, and truncation error. The advantages of the compact-near-field and very-near-field test ranges are discussed and numerically analyzed. Experimental results are presented for both planar and cylindrical scanning geometries.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
