Discussion to "Bayesian reliability estimation based on a Weibull stress-strength model for aged power system components subjected to voltage surges" / Chiodo, Elio; G., Mazzanti; S., Nadarajah; S., Kotz. - In: IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION. - ISSN 1070-9878. - ELETTRONICO. - 13:4(2006), pp. 935-937. [10.1109/TDEI.2006.1667755]
Discussion to "Bayesian reliability estimation based on a Weibull stress-strength model for aged power system components subjected to voltage surges"
CHIODO, ELIO;
2006
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