The aim of this paper is to analyze the typical voltage and current waveforms of UIS test in order to find signature of uneven current conduction behavior. This information could help the identification of phenomena that can eventually lead to device failure, reduce its capability of sustaining high currents in avalanche operation or impair long-term device reliability.
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments / Irace, Andrea; Spirito, Paolo; Riccio, Michele; Breglio, Giovanni. - STAMPA. - (2012), pp. 165-168. (Intervento presentato al convegno Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on tenutosi a Bruges, Belgium nel 3-7 June 2012) [10.1109/ISPSD.2012.6229049].
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments
IRACE, ANDREA;SPIRITO, PAOLO;RICCIO, MICHELE;BREGLIO, GIOVANNI
2012
Abstract
The aim of this paper is to analyze the typical voltage and current waveforms of UIS test in order to find signature of uneven current conduction behavior. This information could help the identification of phenomena that can eventually lead to device failure, reduce its capability of sustaining high currents in avalanche operation or impair long-term device reliability.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
