A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.
Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface / M., Salluzzo; S., Gariglio; X., Torrelles; Z., Ristic; DI CAPUA, Roberto; J., Drnec; M., Moretti Sala; G., Ghiringhelli; R., Felici; N. B., Brookes. - In: ADVANCED MATERIALS. - ISSN 0935-9648. - 25:16(2013), pp. 2333-2338. [10.1002/adma.201204555]
Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface
DI CAPUA, ROBERTO;
2013
Abstract
A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.| File | Dimensione | Formato | |
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