Enhancing second-order optical processes in Si-compatible materials is important for the demonstration of innovative functionalities and nonlinear optical devices integrated on a chip. Here, we demonstrate significantly enhanced Second-Harmonic Generation (SHG) by silicon-rich silicon nitride materials over a broad spectral range, and show a maximum conversion efficiency of 4.5 × 10-6 for sub-stoichiometric samples with 46 at. silicon. The SHG process in silicon nitride thin films is systematically investigated over a range of material stoichiometry and thermal annealing conditions. These findings can enable the engineering of innovative Si-based devices for nonlinear signal processing and sensing applications on a Si platform. © 2013 AIP Publishing LLC.

Generation of second harmonic radiation from sub-stoichiometric silicon nitride thin films / Emanuele Francesco, Pecora; Capretti, Antonio; Miano, Giovanni; Luca Dal, Negro. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 102:(2013), p. 141114. [10.1063/1.4801873]

Generation of second harmonic radiation from sub-stoichiometric silicon nitride thin films

CAPRETTI, ANTONIO;MIANO, GIOVANNI;
2013

Abstract

Enhancing second-order optical processes in Si-compatible materials is important for the demonstration of innovative functionalities and nonlinear optical devices integrated on a chip. Here, we demonstrate significantly enhanced Second-Harmonic Generation (SHG) by silicon-rich silicon nitride materials over a broad spectral range, and show a maximum conversion efficiency of 4.5 × 10-6 for sub-stoichiometric samples with 46 at. silicon. The SHG process in silicon nitride thin films is systematically investigated over a range of material stoichiometry and thermal annealing conditions. These findings can enable the engineering of innovative Si-based devices for nonlinear signal processing and sensing applications on a Si platform. © 2013 AIP Publishing LLC.
2013
Generation of second harmonic radiation from sub-stoichiometric silicon nitride thin films / Emanuele Francesco, Pecora; Capretti, Antonio; Miano, Giovanni; Luca Dal, Negro. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 102:(2013), p. 141114. [10.1063/1.4801873]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/588369
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