We present a method for determining the dielectric function of opaque materials precisely and reproducibly in the frequency range from 8 to 30 THz and higher. Our approach is based on measuring the polarization- and phase-resolved THz electrical transients reflected by the sample. This mid-infrared time-domain ellipsometry is applied to pure and Nb-doped strontium titanate SrTiO3, which allows us to infer the longitudinal and transverse optical phonon frequencies and the free-carrier plasma frequency as a function of the charge carrier concentration. We extract and discuss the value of the effective mass of the charge carriers. VC
Mid-infrared time-domain ellipsometry: Application to Nb-doped SrTiO 3 / Rubano, Andrea; Braun, Lukas; Wolf, Martin; Kampfrath, Tobias. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 101:8(2012), p. 081103. [10.1063/1.4746263]
Mid-infrared time-domain ellipsometry: Application to Nb-doped SrTiO 3
Rubano, Andrea
;
2012
Abstract
We present a method for determining the dielectric function of opaque materials precisely and reproducibly in the frequency range from 8 to 30 THz and higher. Our approach is based on measuring the polarization- and phase-resolved THz electrical transients reflected by the sample. This mid-infrared time-domain ellipsometry is applied to pure and Nb-doped strontium titanate SrTiO3, which allows us to infer the longitudinal and transverse optical phonon frequencies and the free-carrier plasma frequency as a function of the charge carrier concentration. We extract and discuss the value of the effective mass of the charge carriers. VC| File | Dimensione | Formato | |
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