Reflectometry is a powerful technique that can be effectively employed for a number of practical applications; in particular, the high versatility, the real-time response, and the potential for practical implementation have contributed to the success of microwave reflectometry for monitoring purposes. In this regard, this paper provides a survey of the current state of the art of reflectometry-based methods for diagnostics and monitoring applications. After a brief overview of the theoretical principles at the base of this technique, the different approaches of microwave reflectometry (time domain, frequency domain, and combined approaches) are fully discussed; particular attention is given to the strategies for enhancing measurement accuracy. Finally, the major practical applications of reflectometry and related results are discussed, thus evidencing current achievements, limitations, and potential. © 2010 IEEE.
Broadband reflectometry for diagnostics and monitoring applications / Cataldo, A.; De Benedetto, E.. - In: IEEE SENSORS JOURNAL. - ISSN 1530-437X. - 11:2(2011), pp. 451-459. [10.1109/JSEN.2010.2060322]
Broadband reflectometry for diagnostics and monitoring applications
De Benedetto E.
2011
Abstract
Reflectometry is a powerful technique that can be effectively employed for a number of practical applications; in particular, the high versatility, the real-time response, and the potential for practical implementation have contributed to the success of microwave reflectometry for monitoring purposes. In this regard, this paper provides a survey of the current state of the art of reflectometry-based methods for diagnostics and monitoring applications. After a brief overview of the theoretical principles at the base of this technique, the different approaches of microwave reflectometry (time domain, frequency domain, and combined approaches) are fully discussed; particular attention is given to the strategies for enhancing measurement accuracy. Finally, the major practical applications of reflectometry and related results are discussed, thus evidencing current achievements, limitations, and potential. © 2010 IEEE.File | Dimensione | Formato | |
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