An accurate and flexible system for magnetic permeability measurements is described. In particular, effects such as eddy currents and signal drift are minimized by exploiting the main system features: (i) high-performance digital integration by means of a digital integrator, with a theoretical resolution of 10 ppt using an 18-Bit A/D Converter at 800 kS/s, specifically developed for magnetic measurements, and (ii) flexibility of the measurement procedure for overcoming magnetic field non-uniformity errors through a procedure specifically generated by means of a flexible software framework. In particular, the theoretical background underlying the measurement, the procedure, and the system architecture are illustrated, as well as experimental results from testing a nonoriented steel are described. © 2010 IEEE.
High-performance permeability measurements: A case study at CERN / Arpaia, P.; Buzio, M.; Fiscarelli, L.; Montenero, G.; Walckiers, L.. - (2010), pp. 58-61. (Intervento presentato al convegno 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 tenutosi a Austin, TX, usa nel 2010) [10.1109/IMTC.2010.5488003].
High-performance permeability measurements: A case study at CERN
Arpaia P.;
2010
Abstract
An accurate and flexible system for magnetic permeability measurements is described. In particular, effects such as eddy currents and signal drift are minimized by exploiting the main system features: (i) high-performance digital integration by means of a digital integrator, with a theoretical resolution of 10 ppt using an 18-Bit A/D Converter at 800 kS/s, specifically developed for magnetic measurements, and (ii) flexibility of the measurement procedure for overcoming magnetic field non-uniformity errors through a procedure specifically generated by means of a flexible software framework. In particular, the theoretical background underlying the measurement, the procedure, and the system architecture are illustrated, as well as experimental results from testing a nonoriented steel are described. © 2010 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
