The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging requirements, in particular for Common Mode Rejection Ratio (CMRR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).
Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements / Arpaia, P.; Baccigalupi, C.; Martino, M.. - 2015-:(2015), pp. 1532-1536. (Intervento presentato al convegno 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 tenutosi a Palazzo dei Congressi, ita nel 2015) [10.1109/I2MTC.2015.7151506].
Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements
Arpaia P.;
2015
Abstract
The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging requirements, in particular for Common Mode Rejection Ratio (CMRR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
