This work derives from the requirement to investigate on the silver surface enrichment of objects of historical and artistic interest using the X-ray fluorescence non-destructive technique (XRF). The aim is the thickness estimation through the experimental relationship between K K α β and K Lα α of Ag as a function of the thickness. Measurements on silver sheets of different thicknesses and three concentrations are carried out using a XRF spectrometer with a maximum voltage of 50 kV. The results allow to analyse the plating layer of silver objects also to make other interesting considerations. © 2018 Societa Italiana di Fisica. All rights reserved.
Ag X-ray fluorescence on different thickness and concentration layers / Brocchieri, J.; Scialla, E.; Ambrosino, F.; Terrasi, F.; Sabbarese, C.. - In: IL NUOVO CIMENTO C. - ISSN 2037-4909. - 41:6(2018), p. 224. [10.1393/ncc/i2018-18224-3]
Ag X-ray fluorescence on different thickness and concentration layers
Ambrosino F.Software
;Sabbarese C.
2018
Abstract
This work derives from the requirement to investigate on the silver surface enrichment of objects of historical and artistic interest using the X-ray fluorescence non-destructive technique (XRF). The aim is the thickness estimation through the experimental relationship between K K α β and K Lα α of Ag as a function of the thickness. Measurements on silver sheets of different thicknesses and three concentrations are carried out using a XRF spectrometer with a maximum voltage of 50 kV. The results allow to analyse the plating layer of silver objects also to make other interesting considerations. © 2018 Societa Italiana di Fisica. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
