DALIENTO, SANTOLO
DALIENTO, SANTOLO
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy
2006 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo
An experimental analysis of localized lifetime and resistivity control by helium implant in Si
2005 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo
An Improved Test Structure for Recombination Lifetime Profile Measurements in Very Thick Silicon Wafers
1999 Daliento, Santolo; A., Sanseverino; P., Spirito
Experimental Measurements of Majority and Minority Carrier Lifetime Profile in SI Epilayers by the Use of an Improved OCVD Method
2005 S., Bellone; G. D., Licciardo; Daliento, Santolo; L., Mele
Experimental measurements of recombination lifetime in proton irradiated power devices
2000 Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss
Induced degradation on c-Si solar cells for concentration terrestrial applications
2010 L., Lancellotti; R., Fucci; A., Romano; A., Sarno; Daliento, Santolo
Recombination Centers Identification in Very Thin Silicon Epitaxial Layers via Lifetime Measurements
1996 Daliento, Santolo; A., Sanseverino; P. M., Sarro; P., Spirito; L., Zeni
Analytical modelling and minority current measurements for the determination of the emitter surface recombination velocity in silicon solar cells
2007 Daliento, Santolo; Mele, L; Bobeico, E; Lancellotti, L; Morvillo, P.
Approximate closed form analytical solution for minority carrier transport in opaque heavily doped regions under illuminated conditions
2006 Daliento, Santolo; L., Mele
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE
2003 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
Two dimensional analysis of a test structure for lifetime profile measurements
1995 Daliento, Santolo; Rinaldi, Niccolo'; Sanseverino, Annunziata; P., Spirito
Two Dimensional Analysis of a Test Structure for Lifetime Profile Measurements
1995 Daliento, Santolo; N., Rinaldi; A., Sanseverino; P., Spirito
Analytical three-dimensional modelling of the potential distribution in theEmitter of concentrator solar cells under non uniform illumination
2010 Costagliola, Maurizio; Daliento, Santolo; L., Lancellotti; F., Roca
Elettronica Generale
2011 Daliento, Santolo; Irace, Andrea
An Analysis On The Recombination Mechanisms In The Intrinsic Layer Of P-i-N a-Si:H Solar Cell
2011 Tari, Orlando; Daliento, Santolo; Fanelli, Esther; Aronne, Antonio; Pernice, Pasquale; L., Lancellotti; P., Delli Veneri; L. V., Mercaldo; I., Usatii
A new measurement technique for the conductivity mobility versus injection level in Silicon
1997 S., Bellone; G. V., Persiano; Strollo, ANTONIO GIUSEPPE MARIA; Daliento, Santolo
PERFORMANCES CHARACTERIZATION OF CONCENTRATION SOLAR CELLS BY MEANS OF I-V AND LIFETIME MEASUREMENTS MADE WITH THE QSSPC TECHNIQUE
2006 Daliento, Santolo; L., Mele; L., Lancellotti; P., Morvillo; E., Bobeico; F., Roca; L., Pirozzi
Improved reverse recovery measurements for the extraction of the recombination lifetime in silicon solar cells
2007 Daliento, Santolo; L., Mele; F., Roca; L., Lancellotti; R., Fucci; P., Morvillo; E., Bobeico
Sol-Gel Preparation of Nanostructured Aluminum doped ZnO (AZO) Thin Films for Photovoltaic Applications
2011 Tari, Orlando; Fanelli, Esther; M. L., Addonizio; Aronne, Antonio; Daliento, Santolo; Pernice, Pasquale
3D Analysis of silicon solar cells for the optimum design of concentration devices
2008 Daliento, Santolo; L., Mele
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy | 4.1 Articoli in Atti di convegno | 2006 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo | |
An experimental analysis of localized lifetime and resistivity control by helium implant in Si | 4.1 Articoli in Atti di convegno | 2005 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo | |
An Improved Test Structure for Recombination Lifetime Profile Measurements in Very Thick Silicon Wafers | 1.1 Articolo in rivista | 1999 | Daliento, Santolo; A., Sanseverino; P., Spirito | |
Experimental Measurements of Majority and Minority Carrier Lifetime Profile in SI Epilayers by the Use of an Improved OCVD Method | 1.1 Articolo in rivista | 2005 | S., Bellone; G. D., Licciardo; Daliento, Santolo; L., Mele | |
Experimental measurements of recombination lifetime in proton irradiated power devices | 4.1 Articoli in Atti di convegno | 2000 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss | |
Induced degradation on c-Si solar cells for concentration terrestrial applications | 1.1 Articolo in rivista | 2010 | L., Lancellotti; R., Fucci; A., Romano; A., Sarno; Daliento, Santolo | |
Recombination Centers Identification in Very Thin Silicon Epitaxial Layers via Lifetime Measurements | 1.1 Articolo in rivista | 1996 | Daliento, Santolo; A., Sanseverino; P. M., Sarro; P., Spirito; L., Zeni | |
Analytical modelling and minority current measurements for the determination of the emitter surface recombination velocity in silicon solar cells | 1.1 Articolo in rivista | 2007 | Daliento, Santolo; Mele, L; Bobeico, E; Lancellotti, L; Morvillo, P. | |
Approximate closed form analytical solution for minority carrier transport in opaque heavily doped regions under illuminated conditions | 1.1 Articolo in rivista | 2006 | Daliento, Santolo; L., Mele | |
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE | 1.1 Articolo in rivista | 2003 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca | |
Two dimensional analysis of a test structure for lifetime profile measurements | 1.1 Articolo in rivista | 1995 | Daliento, Santolo; Rinaldi, Niccolo'; Sanseverino, Annunziata; P., Spirito | |
Two Dimensional Analysis of a Test Structure for Lifetime Profile Measurements | 1.1 Articolo in rivista | 1995 | Daliento, Santolo; N., Rinaldi; A., Sanseverino; P., Spirito | |
Analytical three-dimensional modelling of the potential distribution in theEmitter of concentrator solar cells under non uniform illumination | 4.1 Articoli in Atti di convegno | 2010 | Costagliola, Maurizio; Daliento, Santolo; L., Lancellotti; F., Roca | |
Elettronica Generale | 3.1 Monografia o trattato scientifico | 2011 | Daliento, Santolo; Irace, Andrea | |
An Analysis On The Recombination Mechanisms In The Intrinsic Layer Of P-i-N a-Si:H Solar Cell | 4.1 Articoli in Atti di convegno | 2011 | Tari, Orlando; Daliento, Santolo; Fanelli, Esther; Aronne, Antonio; Pernice, Pasquale; L., Lancellotti; P., Delli Veneri; L. V., Mercaldo; I., Usatii | |
A new measurement technique for the conductivity mobility versus injection level in Silicon | 1.1 Articolo in rivista | 1997 | S., Bellone; G. V., Persiano; Strollo, ANTONIO GIUSEPPE MARIA; Daliento, Santolo | |
PERFORMANCES CHARACTERIZATION OF CONCENTRATION SOLAR CELLS BY MEANS OF I-V AND LIFETIME MEASUREMENTS MADE WITH THE QSSPC TECHNIQUE | 4.1 Articoli in Atti di convegno | 2006 | Daliento, Santolo; L., Mele; L., Lancellotti; P., Morvillo; E., Bobeico; F., Roca; L., Pirozzi | |
Improved reverse recovery measurements for the extraction of the recombination lifetime in silicon solar cells | 4.1 Articoli in Atti di convegno | 2007 | Daliento, Santolo; L., Mele; F., Roca; L., Lancellotti; R., Fucci; P., Morvillo; E., Bobeico | |
Sol-Gel Preparation of Nanostructured Aluminum doped ZnO (AZO) Thin Films for Photovoltaic Applications | 4.1 Articoli in Atti di convegno | 2011 | Tari, Orlando; Fanelli, Esther; M. L., Addonizio; Aronne, Antonio; Daliento, Santolo; Pernice, Pasquale | |
3D Analysis of silicon solar cells for the optimum design of concentration devices | 4.1 Articoli in Atti di convegno | 2008 | Daliento, Santolo; L., Mele |