RINALDI, NICCOLO'

RINALDI, NICCOLO'  

DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE  

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Titolo Tipologia Data di pubblicazione Autore(i) File
Sidewall effects on maximum cutoff frequency fT and forward transit time in downscaled bipolar transistors 1.1 Articolo in rivista 1994 Rinaldi, Niccolo'
Analysis of the depletion layer of exponentially graded pn junctions with nonuniformly doped substrates 1.1 Articolo in rivista 2000 Rinaldi, Niccolo'
Reply to "Comment on Modeling of minority-carrier transport in nonuniformly doped silicon regions with asymptotic expansions" 1.7 Commento, erratum, replica e simili 1995 Rinaldi, Niccolo'
Reply to Comment on modelling of small-signal minority-carrier transport in bipolar devices at arbitrary injection levels 1.7 Commento, erratum, replica e simili 2002 Rinaldi, Niccolo'
Modeling of small-signal minority-carrier transport in bipolar at arbitrary injection levels 1.1 Articolo in rivista 1998 Rinaldi, Niccolo'
All-injection modeling of collector current and transit time in SiGe bipolar transistors 4.1 Articoli in Atti di convegno 1995 Rinaldi, Niccolo'
Analytical modeling and numerical simulations of the thermal behavior of bipolar transistors 8.10 Tesi di Dottorato 2009 Rinaldi, Niccolo'
A single chip 1.8 GHz LNA and power amplifier with improved isolation using micromachining 4.1 Articoli in Atti di convegno 2001 F. M., De Paola; L. N. C., de Vreede; L., Nanver; B., Rejaei; Rinaldi, Niccolo'; J. N., Burghartz
Thermal mapping of new cellular power MOS affected by electro-thermal instability 4.1 Articoli in Atti di convegno 1999 Breglio, Giovanni; F., Frisina; A., Magrì; Rinaldi, Niccolo'; P., Spirito
Modeling two-dimensional effects on base and collector currents in narrow-emitter self-aligned bipolar transistors 1.1 Articolo in rivista 1993 Rinaldi, Niccolo'
Modeling of high-injection effects in bipolar devices 4.1 Articoli in Atti di convegno 1995 Rinaldi, Niccolo'
A simple analytical model of oxidation of silicon 1.1 Articolo in rivista 1999 Rinaldi, Niccolo'
Small-signal operation of semiconductor devices including self-heating, with application to thermal characterization and instability analysis 1.1 Articolo in rivista 2001 Rinaldi, Niccolo'
Modeling of minority-carrier transport in semiconductor regions with position-dependent material parameters at arbitrary injection levels 1.1 Articolo in rivista 1996 Rinaldi, Niccolo'
Modeling of minority-carrier transport in nonuniformly doped silicon regions with asymptotic expansions 1.1 Articolo in rivista 1993 Rinaldi, Niccolo'
Thermal mapping and 3D numerical simulation of new cellular power MOS affected by electro-thermal instability 1.1 Articolo in rivista 2000 Breglio, Giovanni; Rinaldi, Niccolo'; Spirito, P.
On the modeling of the transient thermal behavior of semiconductor devices 1.1 Articolo in rivista 2001 Rinaldi, Niccolo'
Thermal analysis of solid-state devices and circuits: an analytical approach 1.1 Articolo in rivista 2000 Rinaldi, Niccolo'
Generalized image method with application to the thermal modeling of power devices and circuits 1.1 Articolo in rivista 2002 Rinaldi, Niccolo'
A Two-Dimensional Analytical Model of Homojunction GaAs BMFET Structures 1.1 Articolo in rivista 1996 S., Bellone; Rinaldi, Niccolo'; Vitale, GIOVANNI FRANCESCO; G., Cocorullo; G., Schweeger; H. L., Hartnagel