This paper addresses the problem of scaling interconnects to nanometric dimensions in future very-large-scale integration applications. Traditional copper interconnects are compared to innovative interconnects made by bundles of metallic carbon nanotubes. A new model is presented to describe the propagation of electric signals along carbon nanotube (CNT) bundles, in the framework of the classical transmission line theory. A possible implementation of a future scaled microstrip based on CNT bundle is analyzed and compared to a conventional microstrip.
Performance Comparison Between Metallic Carbon Nanotube and Copper Nano-Interconnects / Maffucci, A.; Miano, Giovanni; Villone, F.. - In: IEEE TRANSACTIONS ON ADVANCED PACKAGING. - ISSN 1521-3323. - STAMPA. - 31:4(2008), pp. 692-699. [10.1109/TADVP.2008.2005001]
Performance Comparison Between Metallic Carbon Nanotube and Copper Nano-Interconnects
MIANO, GIOVANNI;Villone F.
2008
Abstract
This paper addresses the problem of scaling interconnects to nanometric dimensions in future very-large-scale integration applications. Traditional copper interconnects are compared to innovative interconnects made by bundles of metallic carbon nanotubes. A new model is presented to describe the propagation of electric signals along carbon nanotube (CNT) bundles, in the framework of the classical transmission line theory. A possible implementation of a future scaled microstrip based on CNT bundle is analyzed and compared to a conventional microstrip.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.