We report on sexithiophene films, about 150-nm thick, grown by thermal evaporation on single-crystal oxides and, as comparison, on Si/SiO(2). By heating the entire deposition chamber at 100A degrees C we obtain standing-up oriented molecules all over the bulk thickness. Surface morphology shows step-like islands, each step being only one monolayer in height. The constant and uniform warming of the molecules obtained by heating the entire deposition chamber allows a stable diffusion-limited growth process. Therefore, the regular growth kinetics is preserved when increasing the thickness of the film. Electrical measurements on differently structured films evidence the impact of the inter-island separation region size on the main charge-transport parameters.
Improved structural ordering in sexithiophene thick films grown on single crystal oxide substrates / Aruta, Carmela; P., D’Angelo; Barra, Mario; Ausanio, Giovanni; Cassinese, Antonio. - In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING. - ISSN 0947-8396. - STAMPA. - 97:2(2009), pp. 387-394. [10.1007/s00339-009-5223-1]
Improved structural ordering in sexithiophene thick films grown on single crystal oxide substrates
ARUTA, CARMELA;BARRA, Mario;AUSANIO, GIOVANNI;CASSINESE, ANTONIO
2009
Abstract
We report on sexithiophene films, about 150-nm thick, grown by thermal evaporation on single-crystal oxides and, as comparison, on Si/SiO(2). By heating the entire deposition chamber at 100A degrees C we obtain standing-up oriented molecules all over the bulk thickness. Surface morphology shows step-like islands, each step being only one monolayer in height. The constant and uniform warming of the molecules obtained by heating the entire deposition chamber allows a stable diffusion-limited growth process. Therefore, the regular growth kinetics is preserved when increasing the thickness of the film. Electrical measurements on differently structured films evidence the impact of the inter-island separation region size on the main charge-transport parameters.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.