The superjunction concept allows the design of power semiconductor devices with improved performances compared to conventional sustaining layers. Due to the lack of accurate analytical models to characterize superjunction devices the design phase is still based on numerous and time consuming finite element simulations. In this paper a closed form analytical solution for the calculation of the breakdown voltage of a superjunction symmetric and charge balanced diode, is presented. The calculation of the breakdown voltage is based on the approximated solution of the ionization integral. The proposed solution is based on the Taylor expansion coupled with Newton Raphson algorithm.

Analytical calculation of the breakdown voltage for balanced, symmetrical superjunction power devices / Napoli, Ettore; H., Wang; F., Udrea. - (2010), pp. 205-208. (Intervento presentato al convegno 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD), 2010 tenutosi a Hiroshima nel 6-10 June 2010).

Analytical calculation of the breakdown voltage for balanced, symmetrical superjunction power devices

NAPOLI, ETTORE;
2010

Abstract

The superjunction concept allows the design of power semiconductor devices with improved performances compared to conventional sustaining layers. Due to the lack of accurate analytical models to characterize superjunction devices the design phase is still based on numerous and time consuming finite element simulations. In this paper a closed form analytical solution for the calculation of the breakdown voltage of a superjunction symmetric and charge balanced diode, is presented. The calculation of the breakdown voltage is based on the approximated solution of the ionization integral. The proposed solution is based on the Taylor expansion coupled with Newton Raphson algorithm.
2010
9781424477180
Analytical calculation of the breakdown voltage for balanced, symmetrical superjunction power devices / Napoli, Ettore; H., Wang; F., Udrea. - (2010), pp. 205-208. (Intervento presentato al convegno 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD), 2010 tenutosi a Hiroshima nel 6-10 June 2010).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/389115
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