RICCIO, MICHELE
RICCIO, MICHELE
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
An ultrafast IR thermography system for transient temperature detection on electronic devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)
2014 Romano, Gianpaolo; Riccio, Michele; DE FALCO, Giuseppe; Maresca, Luca; Irace, Andrea; Breglio, Giovanni
ELDO-COMSOL based 3D electro-thermal simulations of power semiconductor devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)
2014 DE FALCO, Giuseppe; Riccio, Michele; Romano, Gianpaolo; Maresca, Luca; Irace, Andrea; Breglio, Giovanni
Short-circuit robustness of SiC Power MOSFETs: Experimental analysis2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
2014 Alberto, Castellazzi; Asad, Fayyaz; Li, Yang; Riccio, Michele; Irace, Andrea
50W X-band GaN MMIC HPA: Effective Power Capability and Transient Thermal Analysis
2010 C., Costrini; A., Cetronio; P., Romanini; Breglio, Giovanni; Irace, Andrea; Riccio, Michele
Temperature dependence of the resonance frequency of thermogravimetric devices
2010 E., Iervolino; Riccio, Michele; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; W., van der Vlist; P. M., Sarroc
An equivalent time temperature mapping system with a 320x256 pixel full frame 100kHz sampling rate
2007 Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention
2009 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Experimental analysis of electro-thermal instability in SiC Power MOSFETs
2013 Riccio, Michele; A., Castellazzi; DE FALCO, Giuseppe; Irace, Andrea
Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
2014 Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: experiments and simulations
2011 Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Napoli, Ettore; Y., Mizuno
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing
2010 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Thermal-aware design and fault analysis of a DC/DC parallel resonant converter
2014 DE FALCO, Giuseppe; Riccio, Michele; Breglio, Giovanni; Irace, Andrea
Analytical modeling and experimental verification of the three-dimensional current distribution on the top surface of silicon solar cells operating under concentrated sunlight
2011 Costagliola, Maurizio; Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Daliento, Santolo
A Dynamic Temperature Mapping System with a 320x256 Pixels Frame Size and 100kHz Sampling Rate
2008 Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell
2011 Maresca, L.; DE LAURENTIS, Martina; Riccio, Michele; Irace, Andrea; Breglio, Giovanni
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography
2008 Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta
3D electro-thermal simulations of wide area power devices operating in avalanche condition
2012 Riccio, Michele; DE FALCO, Giuseppe; Maresca, L.; Breglio, Giovanni; Napoli, Ettore; Irace, Andrea; Iwahashi, Y.; Spirito, P.
Electro-thermal analysis of MEMS microhotplates for the optimization of temperature uniformity
2011 L., Mele; T., Rossi; Riccio, Michele; E., Iervolino; F., Santagata; Irace, Andrea; Breglio, Giovanni; J. F., Creemer; P. M., Sarro
Thermal simulation and ultrafast IR temperature mapping of a Smart Power Switch for automotive applications
2009 Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; . Kosel V, .; Glavanovics, M.; Satka, A.
Impact of gate drive voltage on avalanche robustness of trench IGBTs
2014 Riccio, Michele; Maresca, Luca; Irace, Andrea; Breglio, Giovanni; Y., Iwahashi
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
An ultrafast IR thermography system for transient temperature detection on electronic devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) | 4.1 Articoli in Atti di convegno | 2014 | Romano, Gianpaolo; Riccio, Michele; DE FALCO, Giuseppe; Maresca, Luca; Irace, Andrea; Breglio, Giovanni | |
ELDO-COMSOL based 3D electro-thermal simulations of power semiconductor devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) | 4.1 Articoli in Atti di convegno | 2014 | DE FALCO, Giuseppe; Riccio, Michele; Romano, Gianpaolo; Maresca, Luca; Irace, Andrea; Breglio, Giovanni | |
Short-circuit robustness of SiC Power MOSFETs: Experimental analysis2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) | 4.1 Articoli in Atti di convegno | 2014 | Alberto, Castellazzi; Asad, Fayyaz; Li, Yang; Riccio, Michele; Irace, Andrea | |
50W X-band GaN MMIC HPA: Effective Power Capability and Transient Thermal Analysis | 4.1 Articoli in Atti di convegno | 2010 | C., Costrini; A., Cetronio; P., Romanini; Breglio, Giovanni; Irace, Andrea; Riccio, Michele | |
Temperature dependence of the resonance frequency of thermogravimetric devices | 1.1 Articolo in rivista | 2010 | E., Iervolino; Riccio, Michele; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; W., van der Vlist; P. M., Sarroc | |
An equivalent time temperature mapping system with a 320x256 pixel full frame 100kHz sampling rate | 1.1 Articolo in rivista | 2007 | Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention | 1.1 Articolo in rivista | 2009 | Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
Experimental analysis of electro-thermal instability in SiC Power MOSFETs | 1.1 Articolo in rivista | 2013 | Riccio, Michele; A., Castellazzi; DE FALCO, Giuseppe; Irace, Andrea | |
Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) | 4.1 Articoli in Atti di convegno | 2014 | Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi | |
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: experiments and simulations | 4.1 Articoli in Atti di convegno | 2011 | Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Napoli, Ettore; Y., Mizuno | |
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing | 1.1 Articolo in rivista | 2010 | Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
Thermal-aware design and fault analysis of a DC/DC parallel resonant converter | 1.1 Articolo in rivista | 2014 | DE FALCO, Giuseppe; Riccio, Michele; Breglio, Giovanni; Irace, Andrea | |
Analytical modeling and experimental verification of the three-dimensional current distribution on the top surface of silicon solar cells operating under concentrated sunlight | 1.1 Articolo in rivista | 2011 | Costagliola, Maurizio; Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Daliento, Santolo | |
A Dynamic Temperature Mapping System with a 320x256 Pixels Frame Size and 100kHz Sampling Rate | 4.1 Articoli in Atti di convegno | 2008 | Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell | 4.1 Articoli in Atti di convegno | 2011 | Maresca, L.; DE LAURENTIS, Martina; Riccio, Michele; Irace, Andrea; Breglio, Giovanni | |
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography | 1.1 Articolo in rivista | 2008 | Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta | |
3D electro-thermal simulations of wide area power devices operating in avalanche condition | 1.1 Articolo in rivista | 2012 | Riccio, Michele; DE FALCO, Giuseppe; Maresca, L.; Breglio, Giovanni; Napoli, Ettore; Irace, Andrea; Iwahashi, Y.; Spirito, P. | |
Electro-thermal analysis of MEMS microhotplates for the optimization of temperature uniformity | 1.1 Articolo in rivista | 2011 | L., Mele; T., Rossi; Riccio, Michele; E., Iervolino; F., Santagata; Irace, Andrea; Breglio, Giovanni; J. F., Creemer; P. M., Sarro | |
Thermal simulation and ultrafast IR temperature mapping of a Smart Power Switch for automotive applications | 4.1 Articoli in Atti di convegno | 2009 | Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; . Kosel V, .; Glavanovics, M.; Satka, A. | |
Impact of gate drive voltage on avalanche robustness of trench IGBTs | 1.1 Articolo in rivista | 2014 | Riccio, Michele; Maresca, Luca; Irace, Andrea; Breglio, Giovanni; Y., Iwahashi |