RICCIO, MICHELE
RICCIO, MICHELE
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
An ultrafast IR thermography system for transient temperature detection on electronic devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)
2014 Romano, Gianpaolo; Riccio, Michele; DE FALCO, Giuseppe; Maresca, Luca; Irace, Andrea; Breglio, Giovanni
Resonance frequency of locally heated cantilever beams
2013 E., Iervolino; Riccio, Michele; F., Santagata; J., Wei; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; P. M., Sarro
Thermal-aware design and fault analysis of a DC/DC parallel resonant converter
2014 DE FALCO, Giuseppe; Riccio, Michele; Breglio, Giovanni; Irace, Andrea
Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching
2012 J., Rhayem; A., Wieers; A., Vrbicky; P., Moens; A., Villamor Baliarda; J., Roig; P., Vanmeerbeek; Irace, Andrea; Riccio, Michele; M., Tack
Thermal simulation and ultrafast IR temperature mapping of a Smart Power Switch for automotive applications
2009 Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; . Kosel V, .; Glavanovics, M.; Satka, A.
Lock-in thermography for the localization of prebreakdown leakage current on power diodes
2009 Irace, Andrea; Breglio, Giovanni; Riccio, Michele
Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
2014 Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi
50W X-band GaN MMIC HPA: Effective Power Capability and Transient Thermal Analysis
2010 C., Costrini; A., Cetronio; P., Romanini; Breglio, Giovanni; Irace, Andrea; Riccio, Michele
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing
2010 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Analytical modeling and experimental verification of the three-dimensional current distribution on the top surface of silicon solar cells operating under concentrated sunlight
2011 Costagliola, Maurizio; Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Daliento, Santolo
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: experiments and simulations
2011 Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Napoli, Ettore; Y., Mizuno
Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology
2011 Riccio, Michele; A., Pantellini; Irace, Andrea; Breglio, Giovanni; A., Nanni; C., Lanzieri
3D electro-thermal simulations of wide area power devices operating in avalanche condition
2012 Riccio, Michele; DE FALCO, Giuseppe; Maresca, L.; Breglio, Giovanni; Napoli, Ettore; Irace, Andrea; Iwahashi, Y.; Spirito, P.
Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching
2013 Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography
2010 Riccio, Michele; Rossi, Lucio; Irace, Andrea; Napoli, Ettore; Breglio, Giovanni; Spirito, Paolo; R., Tagami; Y., Mizuno
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention
2009 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell
2011 Maresca, L.; DE LAURENTIS, Martina; Riccio, Michele; Irace, Andrea; Breglio, Giovanni
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography
2008 Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta
An equivalent time temperature mapping system with a 320x256 pixel full frame 100kHz sampling rate
2007 Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
Transmission line pulse system for avalanche characterization of high power semiconductor devicesVLSI Circuits and Systems VI
2013 Riccio, Michele; Giovanni, Ascione; DE FALCO, Giuseppe; Maresca, Luca; DE LAURENTIS, Martina; Irace, Andrea; Breglio, Giovanni
| Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|---|
| An ultrafast IR thermography system for transient temperature detection on electronic devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) | 4.1 Articoli in Atti di convegno | 2014 | Romano, Gianpaolo; Riccio, Michele; DE FALCO, Giuseppe; Maresca, Luca; Irace, Andrea; Breglio, Giovanni | |
| Resonance frequency of locally heated cantilever beams | 1.1 Articolo in rivista | 2013 | E., Iervolino; Riccio, Michele; F., Santagata; J., Wei; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; P. M., Sarro | |
| Thermal-aware design and fault analysis of a DC/DC parallel resonant converter | 1.1 Articolo in rivista | 2014 | DE FALCO, Giuseppe; Riccio, Michele; Breglio, Giovanni; Irace, Andrea | |
| Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching | 4.1 Articoli in Atti di convegno | 2012 | J., Rhayem; A., Wieers; A., Vrbicky; P., Moens; A., Villamor Baliarda; J., Roig; P., Vanmeerbeek; Irace, Andrea; Riccio, Michele; M., Tack | |
| Thermal simulation and ultrafast IR temperature mapping of a Smart Power Switch for automotive applications | 4.1 Articoli in Atti di convegno | 2009 | Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; . Kosel V, .; Glavanovics, M.; Satka, A. | |
| Lock-in thermography for the localization of prebreakdown leakage current on power diodes | 4.1 Articoli in Atti di convegno | 2009 | Irace, Andrea; Breglio, Giovanni; Riccio, Michele | |
| Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) | 4.1 Articoli in Atti di convegno | 2014 | Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi | |
| 50W X-band GaN MMIC HPA: Effective Power Capability and Transient Thermal Analysis | 4.1 Articoli in Atti di convegno | 2010 | C., Costrini; A., Cetronio; P., Romanini; Breglio, Giovanni; Irace, Andrea; Riccio, Michele | |
| A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing | 1.1 Articolo in rivista | 2010 | Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
| Analytical modeling and experimental verification of the three-dimensional current distribution on the top surface of silicon solar cells operating under concentrated sunlight | 1.1 Articolo in rivista | 2011 | Costagliola, Maurizio; Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Daliento, Santolo | |
| Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: experiments and simulations | 4.1 Articoli in Atti di convegno | 2011 | Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Napoli, Ettore; Y., Mizuno | |
| Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology | 1.1 Articolo in rivista | 2011 | Riccio, Michele; A., Pantellini; Irace, Andrea; Breglio, Giovanni; A., Nanni; C., Lanzieri | |
| 3D electro-thermal simulations of wide area power devices operating in avalanche condition | 1.1 Articolo in rivista | 2012 | Riccio, Michele; DE FALCO, Giuseppe; Maresca, L.; Breglio, Giovanni; Napoli, Ettore; Irace, Andrea; Iwahashi, Y.; Spirito, P. | |
| Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching | 1.1 Articolo in rivista | 2013 | Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo | |
| Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography | 1.1 Articolo in rivista | 2010 | Riccio, Michele; Rossi, Lucio; Irace, Andrea; Napoli, Ettore; Breglio, Giovanni; Spirito, Paolo; R., Tagami; Y., Mizuno | |
| 1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention | 1.1 Articolo in rivista | 2009 | Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
| Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell | 4.1 Articoli in Atti di convegno | 2011 | Maresca, L.; DE LAURENTIS, Martina; Riccio, Michele; Irace, Andrea; Breglio, Giovanni | |
| Detection of localized UIS failure on IGBTs with the aid of lock-in thermography | 1.1 Articolo in rivista | 2008 | Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta | |
| An equivalent time temperature mapping system with a 320x256 pixel full frame 100kHz sampling rate | 1.1 Articolo in rivista | 2007 | Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
| Transmission line pulse system for avalanche characterization of high power semiconductor devicesVLSI Circuits and Systems VI | 4.1 Articoli in Atti di convegno | 2013 | Riccio, Michele; Giovanni, Ascione; DE FALCO, Giuseppe; Maresca, Luca; DE LAURENTIS, Martina; Irace, Andrea; Breglio, Giovanni |